North America
TAKEX America Inc.

151 San Zeno Way, Sunnyvale
CA 94086, USA

(877) 371-2727
Latest news
ASIS 2017
TAKEX America, Inc. is pleased to announce that we will be hosting a booth at the ASIS International 63rd Annual Seminar & Exhibits (ASIS 2017) i ...more
ESX 2017
TAKEX will be exhibiting at ESX 2017, June 14 & 15, 2017 at the Music City Center in Nashville, TN booth #807. ESX is where cutting edge business ...more
(877) 371-2727
TAKEX America Inc.
151 San Zeno Way, Sunnyvale CA 94086, USA
Wafer/FPD/Solar / ASW Series Wafer Mapping Sensor

ASW Series Wafer Mapping Sensor

Description

To detect silicon carbide, sapphire, silicon and other translucent wafers.

 

 

 

 

 

 

 

 

Detection Method Model
Wafer pitch Operation mode
No. of Channels Output
Through Beam ASW-SG625AP 4.76 mm Dark ON 25 Channels NPN
ASW-SG85F 6.35 mm
ASW-SG85F-Y05
ASW-SG86F
ASW-SG86F-Y05
ASW-SG125VF 10 mm

 

Features


  • To detect Silicon Carbide, Sapphire, Silicon and other translucent wafers
  • Applicable to 6, 8 and 12 inch wafers
  • Translucent wafer mode (8 and 12 inch models)
  • Free from Electrostatic effects (comb sensor unit)

  

Details

  • Downloads
Catalogue