North America
TAKEX America Inc.

151 San Zeno Way, Sunnyvale
CA 94086, USA

(877) 371-2727
Latest news
ISC West 2018
TAKEX America, Inc. will be exhibiting at ISC-West 2018, April 11-13 2018 at the Sands Expo & Convention Center, Las Vegas NV - booth #4124. ISC ...more
ATX West 2018
We will be exhibiting at ATX West, Booth 4077 February 6-8, 2018 - Anaheim Convention Center, CA. ATX West connects you with serious automation and r ...more
(877) 371-2727
TAKEX America Inc.
151 San Zeno Way, Sunnyvale CA 94086, USA
Wafer/FPD/Solar / ASW Series Wafer Mapping Sensor

ASW Series Wafer Mapping Sensor

Description

To detect silicon carbide, sapphire, silicon and other translucent wafers.

 

 

 

 

 

 

 

 

Detection Method Model
Wafer pitch Operation mode
No. of Channels Output
Through Beam ASW-SG625AP 4.76 mm Dark ON 25 Channels NPN
ASW-SG85F 6.35 mm
ASW-SG85F-Y05
ASW-SG86F
ASW-SG86F-Y05
ASW-SG125VF 10 mm

 

Features


  • To detect Silicon Carbide, Sapphire, Silicon and other translucent wafers
  • Applicable to 6, 8 and 12 inch wafers
  • Translucent wafer mode (8 and 12 inch models)
  • Free from Electrostatic effects (comb sensor unit)

  

Details

  • Downloads
Catalogue